TrenchStop® Series
IGW08T120
q
Figure A. Definition of switching times
τ1
r1
Tj (t)
p(t)
r1
τ2
r2
r2
τn
rn
rn
TC
Figure D. Thermal equivalent
circuit
Figure B. Definition of switching losses
Power Semiconductors
11
Figure E. Dynamic test circuit
Leakage inductance Lσ =180nH
a nd Stray capacity Cσ =39pF.
Rev. 2.6 Nov. 09