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FIN3386MTDX View Datasheet(PDF) - Fairchild Semiconductor

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FIN3386MTDX Datasheet PDF : 21 Pages
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Test Circuits
Figure 5. Differential LVDS Output DC Test Circuit
Notes:
A: For all input pulses, tR or tF<=1ns.
B: CL includes all probe and jig capacitance.
Figure 6. Differential Receiver Voltage Definitions, Propagation Delay, and Transition Time Test Circuit
Table 4. Receiver Minimum and Maximum Input Threshold Test Voltages
Applied Voltages (V)
VIA
VIB
1.25
1.15
1.15
1.25
2.40
2.30
2.30
2.40
0.10
0
0
0.10
1.50
0.90
0.90
1.50
2.40
1.80
1.80
2.40
0.60
0
0
0.60
Resulting Differential
Input Voltage (mV)
VID
100
-100
100
-100
100
-100
600
-600
600
-600
600
-600
Resulting Common
Mode Input Voltage (V)
VICM
1.20
1.20
2.35
2.35
0.05
0.05
1.20
1.20
2.10
2.10
0.30
0.30
© 2003 Fairchild Semiconductor Corporation
FIN3385 / FIN3386 • Rev. 1.0.6
13
www.fairchildsemi.com
 

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