datasheetbank_Logo
Integrated circuits, Transistor, Semiconductors Search and Datasheet PDF Download Site

CAT25C021P-17TE13 View Datasheet(PDF) - Catalyst Semiconductor => Onsemi

Part Name
Description
View to exact match
CAT25C021P-17TE13 Datasheet PDF : 12 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
CAT25CXXX
Advanced
PIN FUNCTIONS
Pin Name
Function
SO
Serial Data Output
SCK
Serial Clock
WP
Write Protect
VCC
+1.8V to +6.0V Power Supply
VSS
Ground
CS
Chip Select
SI
Serial Data Input
RESET/RESET Reset I/O
NC
No Connect
BLOCK DIAGRAM
SENSE AMPS
SHIFT REGISTERS
WORD ADDRESS
BUFFERS
COLUMN
DECODERS
SO
SI
CS
WP
SCK
I/O
CONTROL
SPI
CONTROL
LOGIC
BLOCK
PROTECT
LOGIC
XDEC
E2PROM
ARRAY
DATA IN
STORAGE
STATUS
REGISTER
HIGH VOLTAGE/
TIMING CONTROL
RESET/RESET
Reset Controller
Watchdog
High Precision
VCC Monitor
25CXXX F02.1
RELIABILITY CHARACTERISTICS
Symbol
NEND(3)
TDR(3)
VZAP(3)
ILTH(3)(4)
Parameter
Endurance
Data Retention
ESD Susceptibility
Latch-Up
Min.
1,000,000
100
2000
100
Max.
Units
Cycles/Byte
Years
Volts
mA
Reference Test Method
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
JEDEC Standard 17
Power-Up Timing(1)(2)
Symbol
tPUR
tPUW
Parameter
Power-up to Read Operation
Power-up to Write Operation
Max.
1
1
(1) This parameter is tested initially and after a design or process change that affects the parameter.
(2) tPUR and tPUW are the delays required from the time VCC is stable until the specified operation can be initiated.
(3) This parameter is tested initially and after a design or process change that affects the parameter.
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to VCC +1V.
Units
ms
ms
Stock No. 21085-01 4/98
9-96
 

Share Link: 

datasheetbank.com [ Privacy Policy ] [ Request Datasheet ] [ Contact Us ]