Revision History
NE5550979A Data Sheet
Rev.
1.00
2.00
Date
Nov 25, 2011
Jul 04, 2012
3.00 Mar 12, 2013
Page
−
p.1
p.5
p.6
p.7
p.8
p.9
P3
P5
P7
First edition issued
Description
Summary
Modification of ORDERING INFORMATION
Addition of TEST CIRCUIT SCHEMATIC FOR 157 MHz
Addition of COMPONENT LAYOUT OF TEST CIRCUIT FOR 157 MHz
Addition of TEST CIRCUIT SCHEMATIC FOR 900 MHz
Addition of COMPONENT LAYOUT OF TEST CIRCUIT FOR 900 MHz
Modification of S-PARAMETERS
Modification of COMPONENTS OF TEST CIRCUIT FOR MEASURING
ELECTRICAL CHARACTERISTICS
Modification of TEST CIRCUIT SCHEMATIC FOR 157 MHz
Modification of COMPONENTS OF TEST CIRCUIT FOR MEASURING
ELECTRICAL CHARACTERISTICS
Modification of COMPONENTS OF TEST CIRCUIT FOR MEASURING
ELECTRICAL CHARACTERISTICS
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