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CB35000 View Datasheet(PDF) - STMicroelectronics

Part Name
Description
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CB35000
ST-Microelectronics
STMicroelectronics ST-Microelectronics
CB35000 Datasheet PDF : 16 Pages
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CB35000 SERIES
core scan cells are provided in the CB35000
Series library. Examples include FDxS/FJKxS
cells which are edge sensitive and LSxx cells
which are true LSSD cells. Non-overlapping clock
generator macros are also available.
EVALUATION DEVICE
An evaluation device is used to demonstrate the
performance of the CB35000 series as well as
verify the effectiveness of the design system. The
device has path delays, latches, a host of
macrocells and memory functions which were
used to verify the simulated characteristics that
are supplied in the data book. Characterization of
the path delays including interconnect shows
typical delays of 210 ps for a 2 input NAND with
receivers/drivers operating at frequencies of 200
MHz. The evaluation device is available in a 208
pin plastic quad flat pack.
Figure 5
Evaluation Device
8/16
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