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MC74AC02MEL View Datasheet(PDF) - ON Semiconductor

Part Name
Description
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MC74AC02MEL
ON-Semiconductor
ON Semiconductor ON-Semiconductor
MC74AC02MEL Datasheet PDF : 10 Pages
1 2 3 4 5 6 7 8 9 10
MC74AC02, MC74ACT02
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
VCC
Supply Voltage
AC
ACT
Min
Typ
Max
Unit
2.0
5.0
6.0
V
4.5
5.0
5.5
Vin, Vout
DC Input Voltage, Output Voltage (Ref. to GND)
0
VCC
tr, tf
Input Rise and Fall Time (Note 1)
AC Devices except Schmitt Inputs
VCC @ 3.0 V
150
VCC @ 4.5 V
40
VCC @ 5.5 V
25
tr, tf
Input Rise and Fall Time (Note 2)
ACT Devices except Schmitt Inputs
VCC @ 4.5 V
10
VCC @ 5.5 V
8.0
TJ
Junction Temperature (PDIP)
140
TA
Operating Ambient Temperature Range
40
25
85
IOH
Output Current High
IOL
Output Current Low
24
24
1. Vin from 30% to 70% VCC; see individual Data Sheets for devices that differ from the typical input rise and fall times.
2. Vin from 0.8 V to 2.0 V; see individual Data Sheets for devices that differ from the typical input rise and fall times.
V
ns/V
ns/V
°C
°C
mA
mA
DC CHARACTERISTICS
74AC
74AC
Symbol
Parameter
VCC
(V)
TA = +25°C
TA =
40°C to
+85°C
Unit
Conditions
Typ Guaranteed Limits
VIH
Minimum High Level
Input Voltage
VIL
Maximum Low Level
Input Voltage
VOH
Minimum High Level
Output Voltage
3.0
1.5 2.1
2.1
4.5 2.25 3.15
3.15
5.5 2.75 3.85
3.85
3.0
1.5 0.9
0.9
4.5 2.25 1.35
1.35
5.5 2.75 1.65
1.65
3.0 2.99 2.9
2.9
4.5 4.49 4.4
4.4
5.5 5.49 5.4
5.4
VOUT = 0.1 V
V
or VCC 0.1 V
VOUT = 0.1 V
V
or VCC 0.1 V
IOUT = 50 μA
V
VOL
Maximum Low Level
Output Voltage
IIN
Maximum Input
Leakage Current
3.0
2.56
2.46
4.5
3.86
3.76
5.5
4.86
4.76
3.0 0.002 0.1
0.1
4.5 0.001 0.1
0.1
5.5 0.001 0.1
0.1
3.0
0.36
0.44
4.5
0.36
0.44
5.5
0.36
0.44
5.5
±0.1
±1.0
*VIN = VIL or VIH
12 mA
V
IOH
24 mA
24 mA
IOUT = 50 μA
V
*VIN = VIL or VIH
V
IOL
12 mA
24 mA
24 mA
μA
VI = VCC, GND
IOLD
IOHD
ICC
†Minimum Dynamic
Output Current
Maximum Quiescent
Supply Current
5.5
75
5.5
75
5.5
4.0
40
mA
VOLD = 1.65 V Max
mA
VOHD = 3.85 V Min
μA
VIN = VCC or GND
*All outputs loaded; thresholds on input associated with output under test.
†Maximum test duration 2.0 ms, one output loaded at a time.
NOTE: IIN and ICC @ 3.0 V are guaranteed to be less than or equal to the respective limit @ 5.5 V VCC.
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