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74LV175DB View Datasheet(PDF) - Philips Electronics

Part NameDescriptionManufacturer
74LV175DB Quad D-type flip-flop with reset; positive-edge trigger Philips
Philips Electronics Philips
74LV175DB Datasheet PDF : 13 Pages
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Philips Semiconductors
Quad D-type flip-flop with reset; positive-edge trigger
Product specification
74LV175
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
CONDITIONS
MIN
TYP
MAX
UNIT
VCC
VI
VO
Tamb
DC supply voltage
Input voltage
Output voltage
Operating ambient temperature range in free air
See Note 1
See DC and AC
characteristics
1.0
3.3
3.6
V
0
VCC
V
0
VCC
V
–40
–40
+85
+125
°C
tr, tf
Input rise and fall times
VCC = 1.0V to 2.0V
VCC = 2.0V to 2.7V
VCC = 2.7V to 3.6V
500
200
ns/V
100
NOTE:
1. The LV is guaranteed to function down to VCC = 1.0V (input levels GND or VCC); DC characteristics are guaranteed from VCC = 1.2V to VCC = 3.6V.
ABSOLUTE MAXIMUM RATINGS1, 2
In accordance with the Absolute Maximum Rating System (IEC 134).
Voltages are referenced to GND (ground = 0V).
SYMBOL
PARAMETER
CONDITIONS
VCC
±IIK
±IOK
±IO
DC supply voltage
DC input diode current
DC output diode current
DC output source or sink current
– standard outputs
VI < –0.5 or VI > VCC + 0.5V
VO < –0.5 or VO > VCC + 0.5V
–0.5V < VO < VCC + 0.5V
RATING
–0.5 to +4.6
20
50
25
UNIT
V
mA
mA
mA
±IGND,
±ICC
DC VCC or GND current for types with
–standard outputs
50
mA
Tstg
Storage temperature range
–65 to +150
°C
Power dissipation per package
for temperature range: –40 to +125°C
–plastic DIL
Ptot
–plastic mini-pack (SO)
above +70°C derate linearly with 12mW/K
750
above +70°C derate linearly with 8 mW/K
500
mW
–plastic shrink mini-pack (SSOP and TSSOP) above +60°C derate linearly with 5.5 mW/K
400
NOTES:
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to
absolute-maximum-rated conditions for extended periods may affect device reliability.
2. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
1998 May 20
4
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