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OP493_96 View Datasheet(PDF) - Analog Devices

Part Name
Description
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OP493_96 Datasheet PDF : 16 Pages
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OP193/OP293/OP493
ELECTRICAL SPECIFICATIONS (@ VS = +2.0 V, VCM = 0.1 V, TA = +25؇C unless otherwise noted)
Parameter
Symbol Conditions
“E” Grade
Min Typ Max
“F” Grade
Min Typ Max
INPUT CHARACTERISTICS
Offset Voltage
VOS
Input Bias Current
IB
Input Offset Current
IOS
Input Voltage Range
VCM
Large Signal Voltage Gain
AVO
Long Term Offset Voltage
POWER SUPPLY
Power Supply Rejection Ratio
VOS
PSRR
Supply Current/Amplifier
ISY
Supply Voltage Range
VS
OP193
OP193, –40°C TA +125°C
OP293
OP293, –40°C TA +125°C
OP493
OP493, –40°C TA +125°C
–40°C TA +125°C
–40°C TA +125°C
RL = 100 k, 0.03 VOUT 1 V
–40°C TA +125°C
Note 1
75
175
100
175
125
225
15
2
0
1
60
70
150
150
250
250
350
275
375
20
4
0
1
60
70
300
VS = +1.7 V to +6 V,
–40°C TA +125°C
VCM = 1.0 V, RL =
–40°C TA +125°C
100
94
13.2 20
25
+2
± 18
97
90
13.2 20
25
+2
± 18
NOISE PERFORMANCE
Voltage Noise Density
Current Noise Density
Voltage Noise
DYNAMIC PERFORMANCE
Slew Rate
Gain Bandwidth Product
en
in
en p-p
SR
GBP
f = 1 kHz
f = 1 kHz
0.1 Hz to 10 Hz
RL = 2 k
65
65
0.05
0.05
3
3
10
10
25
25
Units
µV
µV
µV
µV
µV
µV
nA
nA
V
V/mV
V/mV
µV
dB
µA
µA
V
nV/Hz
pA/Hz
µV p-p
V/ms
kHz
WAFER TEST LIMITS (@ VS = +5.0 V, VCM = 0.1 V, VOUT = 2 V, TA = +25؇C unless otherwise noted)
Parameter
Symbol
Conditions
Limit
Units
Offset Voltage
Input Bias Current
Input Offset Current
Input Voltage Range1
Common-Mode Rejection
Power Supply Rejection Ratio
Large Signal Voltage Gain
Output Voltage Swing High
Output Voltage Swing Low
Supply Current/Amplifier
VOS
IB
IOS
VCM
CMRR
PSRR
AVO
VOH
VOL
ISY
VS = ± 15 V, VOUT = 0 V
VS = +2 V, VOUT = 1.0 V
VCM = 1.0 V
VCM = 1.0 V
0 VCM 4 V
VS = ± 1.5 V to ± 18 V
RL = 100 k
IL = 1 mA
IL = –1 mA
VO = 0 V, RL = , VS = ± 18 V
± 75
± 75
20
4
0 to 4
96
100
100
4.1
400
25
µV max
µV max
nA max
nA max
V min
dB min
dB min
V/mV min
V min
mV max
µA max
NOTES
Electrical tests and wafer probe to the limits shown. Due to variations in assembly methods and normal yield loss, yield after packaging is not guaranteed for standard
product dice. Consult factory to negotiate specifications based on dice lot qualifications through sample lot assembly and testing.
1Guaranteed by CMRR test.
Specifications subject to change without notice.
REV. A
–5–
 

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