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M54HC4066KT View Datasheet(PDF) - STMicroelectronics

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Description
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M54HC4066KT
ST-Microelectronics
STMicroelectronics ST-Microelectronics
M54HC4066KT Datasheet PDF : 37 Pages
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Radiation data
4
Radiation data
M54HCxxx, M54HCTxxx
Each wafer lot is qualified at 50 krad (Si) total dose as per ESCC 22900 specification at 210
rad/hour.
The HC/HCT series is characterized under heavy Ion on 4 functions representative of the
whole series and qualified as per the results of this characterization.
Detailed results are provided in Table 6:
Function
Gate: 54HC08
Multiplexer 54HC157
Flip-flop 54HC273
Counter 54HC4040
Analog mux/demux 54HC4053
Table 6. Radiation data
Result
SEL and SEU free for LET [ 111 MeV/mg/cm²
SEL and SEU free for LET[ 111 MeV/mg/cm²
SEL free for LET [ 111 MeV/mg/cm²
SEU: LETth = 16 MeV/mg/cm², σsat = 1.7 x 10-4 cm²
SEL free for LET [ 111 MeV/mg/cm²
SEU: LETth = 34 MeV/mg/cm², σsat = 4.2 x 10-4 cm²
SEL free for LET [ 111 MeV/mg/cm²
SEU: LETth = 7 MeV/mg/cm², σsat = 2.4 x 10-4 cm²
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DocID17367 Rev 4
 

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