74LVX3245(2001) View Datasheet(PDF) - STMicroelectronics
Part Name
Description
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74LVX3245 Datasheet PDF : 10 Pages
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74LVX3245
CAPACITIVE CHARACTERISTICS
Test Condition
Value
Symbol
Parameter
VCCA VCCB
(V) (V)
TA = 25 °C
-40 to 85 °C -55 to 125°C Unit
Min. Typ. Max. Min. Max. Min. Max.
CIN Input
open open
4.5
V
Capacitance
CI/O Input/Output
3.3 5.0
10
V
Capacitance
CPD Dynamic Low
3.3 5.0
55
V
Level Quiet
Output (note 1)
A to B
CPD Dynamic Low
3.3 5.0
40
V
Level Quiet
Output (note 1)
B to A
1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC/8 (per circuit)
TEST CIRCUIT
TEST
tPLH, tPHL
tPZL, tPLZ
tPZH, tPHZ
CL = 50pF or equivalent (includes jig and probe capacitance)
RL = R1 = 500Ω or equivalent
RT = ZOUT of pulse generator (typically 50Ω)
6/10
SWITCH
Open
2VCC
Open
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