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SI4831-B30 View Datasheet(PDF) - Silicon Laboratories

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SI4831-B30 Datasheet PDF : 20 Pages
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Si4831/35-B30
Table 6. AM/SW Receiver Characteristics1, 2
(VDD = 2.7 to 3.6 V, TA = –15 to 85 °C)
Parameter
Symbol
Test Condition
Min Typ Max
Unit
Input Frequency
fRF
Medium Wave (AM)
504 — 1750
kHz
Short Wave (SW)
5.60 — 22.0
MHz
Sensitivity3,4,5
Large Signal Voltage Handling5
Power Supply Rejection Ratio5
Audio Output Voltage3,6
Audio S/N3,4,6
Audio THD3,6
Antenna Inductance5,7
Powerup/Band Switch Time5
(S+N)/N = 26 dB
30
µV EMF
THD < 8%
— 300 —
VDD = 100 mVRMS, 100 Hz —
40
60
55
mVRMS
dB
mVRMS
dB
— 0.1 0.5
%
180 — 450
µH
From powerdown
— 110
ms
Notes:
1. Additional testing information is available in “AN569: Si4831/35-DEMO Board Test Procedure.” Volume = maximum
for all tests. Tested at RF = 520 kHz.
2. To ensure proper operation and receiver performance, follow the guidelines in “AN555: Si483x-B Antenna, Schematic,
Layout, and Design Guidelines.” Silicon Laboratories will evaluate schematics and layouts for qualified customers.
3. FMOD = 1 kHz, 30% modulation, 2 kHz channel filter.
4. BAF = 300 Hz to 15 kHz, A-weighted.
5. Guaranteed by characterization.
6. VIN = 5 mVrms.
7. Stray capacitance on antenna and board must be < 10 pF to achieve full tuning range at higher inductance levels.
Table 7. Reference Clock and Crystal Characteristics
(VDD = 2.7 to 3.6 V, TA = –15 to 85 °C)
Parameter
Symbol Test Condition
Min
Typ
Max
Unit
XTALI Supported Reference Clock
Frequencies
Reference Clock Frequency
Tolerance for XTALI
Reference Clock
32.768
kHz
–100
100
ppm
Crystal Oscillator Frequency
Crystal Oscillator
32.768
kHz
Crystal Frequency Tolerance
Board Capacitance
–100
100
ppm
3.5
pF
Rev. 1.0
7
 

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