HEF4047B View Datasheet(PDF) - NXP Semiconductors.
Part Name
Description
View to exact match
HEF4047B Datasheet PDF : 20 Pages
| |||
NXP Semiconductors
HEF4047B
Monostable/astable multivibrator
a. Input waveform
9,
QHJDWLYH
SXOVH
9
9,
SRVLWLYH
SXOVH
9
90
WI
WU
90
W:
90
WU
WI
90
W:
DDM
9,
*
9''
'87
9(;7
92
5/
57
&/
DDM
b. Test circuit
Fig 5.
Test and measurement data is given in Table 8.
Definitions test circuit:
DUT = Device Under Test.
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
CL = Load capacitance including jig and probe capacitance.
Test circuit for measuring switching times
Table 8. Test data
Supply voltage Input
VI
5 V to 15 V
VDD
tr, tf
20 ns
Load
CL
50 pF
RL
1 k
11. Application information
VEXT
tPLH, tPHL
open
Table 9. Functional connections [1]
Function
Astable multivibrator
Pins connected to
Output pulse from
VDD
VSS
input pulse pins
Free running
4, 5, 6, 14
7, 8, 9, 12
-
10, 11, 13
True gating
4, 6, 14
7, 8, 9, 12
5
10, 11, 13
Complement gating
6, 14
5, 7, 8, 9, 12
4
10, 11, 13
Output period or
pulse width
at pins 10, 11;
tA = 4.40 RtCt
at pin 13:
tA = 2.20 RtCt
HEF4047B
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 5 — 16 December 2015
© NXP Semiconductors N.V. 2015. All rights reserved.
8 of 20
|
|
Share Link: 