VCEO(sus)
20 Ω
1
5
0V
2
PW Varied to Attain
IC = 100 mA
MJ10023
Table 1. Test Conditions for Dynamic Performance
RBSOA AND INDUCTIVE SWITCHING
INDUCTIVE TEST CIRCUIT
TUT
1
INĆ
SEE ABOVE FOPRUT
DETAILED CONDITIONS
2
1N4937
OR
EQUIVALENT
Vclamp
RS =
0.1 Ω
Rcoil
Lcoil
VCC
Lcoil = 10 mH, VCC = 10 V
Rcoil = 0.7 Ω
Vclamp = VCEO(sus)
ICM
t1
VCEM
TIM
E
Lcoil = 180 µH
Rcoil = 0.05 Ω
VCC = 20 V
OUTPUT WAVEFORMS
tf
Cltamped
tf
Vclamp
t
t2
t1 Adjusted to
Obtain IC
Lcoil (ICM)
t1 [ VCC
Lcoil (ICM)
t2 [ Vclamp
Test Equipment
Scope — Tektronix
475 or Equivalent
RESISTIVE SWITCHING
TURN–ON TIME
1
2
IB1
IB1 adjusted to
obtain the forced
hFE desired
TURN–OFF TIME
Use inductive switching
driver as the input to
the resistive test circuit.
VCC = 250 V
RL = 12.5 Ω
Pulse Width = 25 µs
RESISTIVE TEST CIRCUIT
TUT
1
RL
2
VCC
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