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SPT7720 Просмотр технического описания (PDF) - Fairchild Semiconductor

Номер в каталогеКомпоненты Описаниепроизводитель
SPT7720 8-BIT, 200 MSPS A/D CONVERTER Fairchild
Fairchild Semiconductor Fairchild
SPT7720 Datasheet PDF : 10 Pages
1 2 3 4 5 6 7 8 9 10
ELECTRICAL SPECIFICATIONS
TA=TMIN to TMAX, VDD=+5.0 V, external reference, ƒS=200 MSPS, input amplitude = 1 dBFS, unless otherwise noted
PARAMETERS
TEST
CONDITIONS
TEST
LEVEL
SPT7720
MIN
TYP
Analog Input
Input Voltage Range (differential)
Compliance Range
Input Offset Voltage
Input Offset Voltage
Input Resistance
Input Capacitance
Input Bias Current
Input Bias Current
Full Power Bandwidth
+25 °C
40 °C to +85 °C
+25 °C
+25 °C
40 °C to +85 °C
V
±0.5
V
1.8
I
±4
V
±8
V
36
62
V
4
I
11
V
V
500
Reference Output Voltage
Temperature Coefficient
VI
2.4
2.5
V
110
Differential Digital Inputs
High Level Current
40 to +85 °C
V
500
>1.5 V differential
Low Level Current
40 to +85 °C
V
500
>1.5 V differential
Input Capacitance
V
3
Differential Inputs
Differential Signal Amplitude
High Input Voltage
Low Input Voltage
Common-Mode Input Voltage
IV
400
IV
1.5
IV
0
IV
1.5
Demux Input
High Input Voltage
Low Input Voltage
VI
2.0
VI
0
Digital Outputs
High Output Voltage
Low Output Voltage
Output Coding
Source 800 µA
Sink 1.6 mA
VI
2.4
3.9
VI
0.8
Binary
Power Supply
VDD Supply Current
Power Dissipation
40 to +85 °C
VI
VI
Power Supply Sensitivity
+25 °C
IV
86
430
0.005
MAX UNITS
V
3.2
V
±16 mV
±19 mV
k
pF
50
µA
75
µA
MHz
2.6
V
ppm/°C
625 µA
625 µA
pF
mV
VDD
V
VDD0.4 V
V
VDD
V
0.8
V
V
0.4
V
111 mA
555 mW
0.015 V/V
TEST LEVEL CODES
TEST LEVEL TEST PROCEDURE
All electrical characteristics are subject to the
I
following conditions:
II
All parameters having min/max specifications
are guaranteed. The Test Level column indicates
the specific device testing actually performed
III
during production and Quality Assurance
IV
inspection. Any blank section in the data column
indicates that the specification is not tested at
V
the specified condition.
VI
100% production tested at the specified temperature.
100% production tested at TA = +25 °C, and sample tested at
the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design and
characterization data.
Parameter is a typical value for information purposes only.
100% production tested at TA = +25 °C. Parameter is
guaranteed over specified temperature range.
SPT7720
3
5/9/01
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