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CLC2057 View Datasheet(PDF) - Cadeka Microcircuits LLC.

Part NameDescriptionManufacturer
CLC2057 Dual, Low Noise, Operational Amplifier CADIEKA
Cadeka Microcircuits LLC.  CADIEKA
CLC2057 Datasheet PDF : 13 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
Data Sheet
can be calculated as above with the desired signal ampli-
tudes using:
(VLOAD)RMS = VPEAK / √2
( ILOAD)RMS = ( VLOAD)RMS / Rloadeff
The dynamic power is focused primarily within the output
stage driving the load. This value can be calculated as:
PDYNAMIC = (VS+ - VLOAD)RMS × ( ILOAD)RMS
Assuming the load is referenced in the middle of the pow-
er rails or Vsupply/2.
Figure 4 shows the maximum safe power dissipation in
the package vs. the ambient temperature for the pack-
ages available.
2
Overdrive Recovery
An overdrive condition is defined as the point when ei-
ther one of the inputs or the output exceed their specified
voltage range. Overdrive recovery is the time needed for
the amplifier to return to its normal or linear operating
point. The recovery time varies, based on whether the
input or output is overdriven and by how much the range
is exceeded. The CLC2057 will typically recover in less
than 5μs from an overdrive condition. Figure 6 shows the
CLC2057 in an overdriven condition.
10
Input
5
20
VIN = 7.5Vpp
G=5
10
0
Output
0
1.5
-5
-10
1
SOIC-8
0.5
0
-40
-20
0
20
40
60
80
Ambient Temperature (°C)
-10
0
-20
4
8
12
16
20
Time (us)
Figure 6. Overdrive Recovery
Figure 4. Maximum Power Derating
Driving Capacitive Loads
Increased phase delay at the output due to capacitive
loading can cause ringing, peaking in the frequency re-
sponse, and possible unstable behavior. Use a series resis-
tance, RS, between the amplifier and the load to help im-
prove stability and settling performance. Refer to Figure 5.
Input
+
-
Rf
Rg
Rs
Output
CL
RL
Figure 5. Addition of RS for Driving
Capacitive Loads
Layout Considerations
General layout and supply bypassing play major roles
in high frequency performance. CADEKA has evaluation
boards to use as a guide for high frequency layout and as
an aid in device testing and characterization. Follow the
steps below as a basis for high frequency layout:
• Include 6.8µF and 0.1µF ceramic capacitors for power
supply decoupling
• Place the 6.8µF capacitor within 0.75 inches of the power pin
• Place the 0.1µF capacitor within 0.1 inches of the power pin
• Remove the ground plane under and around the part,
especially near the input and output pins to reduce para-
sitic capacitance
• Minimize all trace lengths to reduce series inductances
Refer to the evaluation board layouts below for more in-
formation.
©2007-2009 CADEKA Microcircuits LLC
www.cadeka.com 10
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