74AHC2G241DP-Q100 View Datasheet(PDF) - NXP Semiconductors.
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74AHC2G241DP-Q100 Datasheet PDF : 16 Pages
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NXP Semiconductors
74AHC2G241-Q100; 74AHCT2G241-Q100
Dual buffer/line driver; 3-state
9,
W:
QHJDWLYH
SXOVH
90
9
WI
9,
SRVLWLYH
SXOVH
WU
90
9
W:
90
WU
WI
90
*
9,
9&&
92
'87
57
9&&
5/ 6
&/
RSHQ
DDG
Fig 7.
Test data is given in Table 10.
Definitions test circuit:
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
CL = Load capacitance including jig and probe capacitance.
RL = Load resistance.
S1 = Test selection switch.
Test circuit for measuring switching times
Table 10. Test data
Type
Input
VI
74AHC2G241-Q100 VCC
74AHCT2G241-Q100 3 V
tr, tf
3 ns
3 ns
Load
CL
15 pF, 50 pF
15 pF, 50 pF
RL
1 k
1 k
S1 position
tPHL, tPLH
open
open
tPZH, tPHZ
GND
GND
tPZL, tPLZ
VCC
VCC
74AHC_AHCT2G241_Q100
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 1 — 12 November 2013
© NXP B.V. 2013. All rights reserved.
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