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ISL12022MAIBZ-T View Datasheet(PDF) - Intersil

Part NameDescriptionManufacturer
ISL12022MAIBZ-T Low Power RTC with Battery Backed SRAM, Integrated ±5ppm Temperature Compensation and Auto Daylight Saving Intersil
Intersil Intersil
ISL12022MAIBZ-T Datasheet PDF : 29 Pages
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ISL12022MA
I2C Interface Specifications Test Conditions: VDD = +2.7 to +5.5V, Temperature = -40°C to +85°C, unless otherwise
specified. Boldface limits apply over the operating temperature range, -40°C to +85°C. (Continued)
SYMBOL
PARAMETER
TEST CONDITIONS
MIN
(Note 7)
TYP
MAX
(Note 8) (Note 7) UNITS NOTES
tSU:DAT Input Data Setup Time From SDA exiting the 30% to 70%
of VDD window, to SCL rising edge
crossing 30% of VDD.
100
tHD:DAT Input Data Hold Time From SCL falling edge crossing 30%
20
of VDD to SDA entering the 30% to
70% of VDD window.
tSU:STO STOP Condition Setup From SCL rising edge crossing 70%
Time
of VDD, to SDA rising edge crossing
30% of VDD.
600
tHD:STO STOP Condition Hold
Time
From SDA rising edge to SCL falling
edge. Both crossing 70% of VDD.
600
tDH Output Data Hold Time From SCL falling edge crossing 30%
0
of VDD, until SDA enters the 30% to
70% of VDD window.
tR
SDA and SCL Rise Time From 30% to 70% of VDD.
20 + 0.1 x Cb
tF
SDA and SCL Fall Time From 70% to 30% of VDD.
20 + 0.1 x Cb
Cb Capacitive Loading of Total on-chip and off-chip
10
SDA or SCL
ns
900
ns
ns
ns
ns
300
300
400
ns 13, 14
ns 13, 14
pF 13, 14
RPU SDA and SCL Bus Pull- Maximum is determined by tR and
1
up Resistor Off-chip tF.
For Cb = 400pF, max is about
2kΩ~2.5kΩ.
For Cb = 40pF, max is about
15kΩ~20kΩ
kΩ 13, 14
NOTES:
7. Parameters with MIN and/or MAX limits are 100% tested at +25°C, unless otherwise specified. Temperature limits established by
characterization and are not production tested.
8. Specified at +25°C.
9. Temperature Conversion is inactive below VBAT = 2.7V. Device operation is not guaranteed at VBAT <1.8V.
10. IRQ/FOUT inactive.
11. VDD > VBAT +VBATHYS
12. In order to ensure proper timekeeping, the VDD SR- specification must be followed.
13. Limits should be considered typical and are not production tested.
14. These are I2C specific parameters and are not tested, however, they are used to set conditions for testing devices to validate
specification.
15. Minimum VDD and/or VBAT of 1V to sustain the SRAM. The value is based on characterization and it is not tested.
7
FN7575.1
July 9, 2010
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