ADRF6655
EVALUATION BOARD LAYOUT AND THERMAL GROUNDING
An evaluation board is available for testing the ADRF6655. The standard evaluation is configured for downconversion applications. Table 5
provides the component values and suggestions for modifying component values for various modes of operation.
VCC
C9
0.1µF
VTUNE
CP
R7
0Ω
C10
100pF
3P3V_LDO
C41
10µF
REFIN
REFOUT
R63
LO
0Ω
R38
R9
R65
0Ω
270Ω
0Ω
R10
C14
68Ω
0.1µF
C15
R37
4.7µF
0Ω
C13
47nF
C40
OPEN
R5
OPEN
R13
R1
0Ω
0Ω
R72
0Ω
C2
10µF
C1
100pF
T7, T8
R62
0Ω
C6 C5
1nF 1nF
R6
0Ω
C8
100pF
VCC
C7
0.1µF
R12
OPEN
VCO_LDO
40 39 38 37 36 35 34 33 32 31
C11
0.1µF
R8
0Ω
C12
100pF
1 VCC1
2 DECL1
3 CP
GND 30
IP3SET 29
GND 28
C31
1nF
R61
49.9Ω
R16
0Ω
R2
OPEN
4 GND
5 RSET
6 REFIN
7 GND
8 MUXOUT
9 DECL2
ADRF6655
VCCMIX 27
INP 26
INN 25
GND 24
GND 23
VCCV2I 22
10 VCC2
GND 21
L3
OPEN
VCC_RF VCC_LO VCC_BB
R29
0Ω
R31
0Ω
C28
10µF
R32
0Ω
VCC
IP3SET
R27
OPEN
C3
0.1µF
R60
OPEN
VCC
C27
0.1µF
R26
0Ω
C24
100pF
VCC_RF
C25
0.1µF
C37
100pF
T4, T5
RF
C38
100pF
R25
0Ω
C22
100pF
VCC_BB
C23
0.1µF
2.5V
R3
10kΩ
C39
10µF
VCC2
R18
C17 0Ω
0.1µF
VCC
R17
0Ω
C19
0.1µF
C16
100pF
DATA
C18
100pF
C33
330pF
R30
100Ω
11 12 13 14 15 16 17 18 19 20
LE
R51
C34
R52
1kΩ
330pF
1kΩ
CLK
C32
330pF
R57 C21
100Ω 100pF
R24
0Ω
R50
1kΩ
VCC_LO
C20
0.1µF
C43
150pF
VCC
VCC
C42
150pF
L1
OPEN
L2
OPEN
C35
OPEN
R58
O P EN
C36
O P EN
IFP
R47
0Ω
R48
0Ω
IFN
R35
100Ω
R43
T3, T6 0Ω
R44
OPEN
R73, R74
0Ω
OUT
R59
C29
0Ω
0.1µF
VCC
1
2
3
4
5
6
7
8
9
VTUNE
R36
0Ω
Figure 82. Evaluation Board Schematic
Rev. 0 | Page 38 of 44