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ML12011EP View Datasheet(PDF) - LANSDALE Semiconductor Inc.

Part Name
Description
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ML12011EP
LANSDALE
LANSDALE Semiconductor Inc. LANSDALE
ML12011EP Datasheet PDF : 14 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
ML12009, ML12011
LANSDALE Semiconductor, Inc.
ELECTRICAL CHARACTERISTICS (Supply Voltage = –5.2 V, unless otherwise noted.)
Characteristic
Symbol
Pin
Under
Test
–30°C
Min
Max
Test Limits
25°C
Min
Max
Power Supply Drain Current
Input Current
ICC1
8
–88
–80
ICC2
6
5.2
5.2
IinH1
15
11
12
13
375
250
375
250
375
250
375
250
IinH2
4
5
1.7
6.0
2.0
6.0
1.7
6.0
2.0
6.0
IinH3
5
IinH4
9
10
0.7
3.0
1.0
3.0
100
100
100
100
Leakage Current
IinL1
15
–10
–10
11
–10
–10
12
–10
–10
13
–10
–10
IinL2
9
–1.6
–1.6
10
–1.6
–1.6
Reference Voltage
Logic ‘1’ Output Voltage
VBB
14
–1.360 –1.160
VOH1
2
–1.100 –0.890 –1.000 –0.810
(Note 1)
3
–1.100 –0.890 –1.000 –0.810
Logic ‘0’ Output Voltage
VOH2
7
–2.8
–2.6
VOL1
2
–1.990 –1.675 –1.950 –1.650
(Note 1)
3
–1.990 –1.675 –1.950 –1.650
Logic ‘1’ Threshold Voltage
VOL2
7
–4.26
–4.40
VOHA
2
–1.120
(Note 2)
3
–1.120
–1.020
–1.020
Logic ‘0’ Threshold Voltage
VOLA
2
(Note 3)
3
–1.655
–1.655
–1.630
–1.630
Short Circuit Current
IOS
7
–65
–20
–65
–20
NOTES: 1. Test outputs of the device must be tested by sequencing through the truth table. All input, power supply and
ground voltages must be maintained between tests. The clock input is the waveform shown.
2. In addition to meeting the output levels specified, the device must divide by 5 or 8 during this test. The clock
input is the waveform shown.
3. In addition to meeting the output levels specified, the device must divide by 6 or 9 during this test. The clock
input is the waveform shown.
85°C
Min
Max
–80
5.2
250
250
250
250
2.0
6.4
2.0
6.4
Unit
mAdc
mAdc
µAdc
mAdc
1.0
–10
–10
–10
–10
–1.6
–1.6
–0.930
–0.930
–2.4
–1.925
–1.925
3.6
100
100
–0.700
–0.700
–1.615
–1.615
µAdc
µAdc
mAdc
Vdc
Vdc
Vdc
–4.48
–0.950
Vdc
–0.950
–1.595 Vdc
–1.595
–65
–20 mAdc
Clock Input
VIHmax
VILmin
Each MECL 10,000 series circuit has been designed to meet the dc specifications shown in the test table, after thermal equilibrium has been
established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 linear fpm is maintained.
Outputs are terminated through a 50 resistor to –2.0 V. Test procedures are shown for only one gate. The other gates are tested in the same
manner.
Page 4 of 14
www.lansdale.com
Issue A
 

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