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FCPF11N60-G View Datasheet(PDF) - Fairchild Semiconductor

Part NameDescriptionManufacturer
FCPF11N60-G DESIGN/PROCESS CHANGE NOTIFICATION Fairchild
Fairchild Semiconductor Fairchild
FCPF11N60-G Datasheet PDF : 14 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
Qualification Plan Device
Package Process
Q20120269
FGD4536TM TT252003 PDP 4GEN Trench IGBT_360V Dpak
No. of Lots
1
Reliability
Test
PRECON
HTGB
HTRB
HTSL
HAST
PRCL
RSDH
TMCL
Condition
Standard
L1 260C
100 % Rated VGS, Tj
max=150C
80% of Rated BV, Tj max=150C
150 C
130 C, 85% RH, Vds=42V
Delta 100C, 2 min on, 3.5 min
off
260C
-65 C to 150 C, 30 min/ cycles
JESD22-A113
JESD22-A108
JESD22-A108
JESD22-A103
JESD22-A110
MIL-STD-750-
1036
JESD22-B106
JESD22-A104
Device Name
Lot No.
Duration
5 Cycles 24
hrs
1000hrs
1000hrs
1000hrs
96hrs
10000 cycles
10 sec
500 cycles
FGD4536TM
Q20120269AA
Result/FA
0/154
0/77
0/77
0/77
0/77
0/77
0/30
0/77
Qualification Plan Device
Q20120270
FCD7N60TM
Package
TT252002
Process
SuperFET_600V Dpak
No. of Lots
1
Reliability
Test
PRECON
HTGB
HTRB
HTSL
HAST
PRCL
RSDH
TMCL
Condition
Standard
L1 260C
100 % Rated VGS, Tj
max=150C
80% of Rated BV, Tj max=150C
150 C
130 C, 85% RH, Vds=42V
Delta 100C, 2 min on, 3.5 min
off
260C
-65 C to 150 C, 30 min/ cycles
JESD22-A113
JESD22-A108
JESD22-A108
JESD22-A103
JESD22-A110
MIL-STD-750-
1036
JESD22-B106
JESD22-A104
Device Name
Lot No.
Duration
5 Cycles 24
hrs
1000hrs
1000hrs
1000hrs
96hrs
10000 cycles
10 sec
500 cycles
FCD7N60TM
Q20120270AA
Result/FA
0/154
0/77
0/77
0/77
0/77
0/77
0/30
0/77
9 of 14
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