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FCPF20N60T View Datasheet(PDF) - Fairchild Semiconductor

Part Name
Description
View to exact match
FCPF20N60T
Fairchild
Fairchild Semiconductor Fairchild
FCPF20N60T Datasheet PDF : 14 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
Qualification Plan
Q20120265
Device
FCB20N60TM
Package Process
TT263002 Super-FET 600V D2pak
No. of Lots
1
Reliability Test
PRECON
HTGB
HTRB
HTSL
HAST
PRCL
RSDH
TMCL
Condition
L1 245C
100 % Rated VGS, Tj
max=150C
80% of Rated BV, Tj
max=150C
150 C
130 C, 85% RH,
Vds=42V
Delta 100C, 3.5 min on,
3.5 min off
260C
-65 C to 150 C, 30 min/
cycles
Standard
JESD22-A113
JESD22-A108
JESD22-A108
JESD22-A103
JESD22-A110
MIL-STD-750-
1036
JESD22-B106
JESD22-A104
Device Name
Lot No.
Duration
5 Cycles 24 hrs
1000hrs
1000hrs
1000hrs
96hrs
8572 cycles
10 sec
500 cycles
FCB20N60TM
Q20120265AA
Result/FA
0/154
0/77
0/77
0/77
0/77
0/77
0/30
0/77
Qualification Plan
Q20120266
Device
FDB52N20TM
Package
TT263002
Process
UNIFET 200V(include 250V
/Dpak and D2 pak)
No. of Lots
1
Reliability Test
PRECON
HTGB
HTRB
HTSL
HAST
PRCL
RSDH
TMCL
Condition
L1 245C
100 % Rated VGS, Tj
max=150C
80% of Rated BV, Tj
max=150C
150 C
130 C, 85% RH,
Vds=42V
Delta 100C, 3.5 min on,
3.5 min off
260C
-65 C to 150 C, 30 min/
cycles
Standard
JESD22-A113
JESD22-A108
Device Name
Lot No.
Duration
5 Cycles 24 hrs
1000hrs
JESD22-A108 1000hrs
JESD22-A103 1000hrs
JESD22-A110
MIL-STD-750-
1036
JESD22-B106
96hrs
8572 cycles
15 sec
JESD22-A104 500 cycles
FDB52N20TM
Q20120266AA
Result/FA
0/154
0/77
0/77
0/77
0/77
0/77
0/30
0/77
7 of 14
 

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