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FCH47N60-F133 View Datasheet(PDF) - Fairchild Semiconductor

Part NameDescriptionManufacturer
FCH47N60-F133 DESIGN/PROCESS CHANGE NOTIFICATION Fairchild
Fairchild Semiconductor Fairchild
FCH47N60-F133 Datasheet PDF : 14 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
Qualification Plan Device
Package Process
Q20120259
FDH50N50_F133 TO247003 UniFET1 300~500V (Over 24A)
No. of Lots
3
Reliability
Test
HTGB
HTRB
HTSL
HAST
PRCL
RSDH
TMCL
Condition
100 %
Rated
VGS, Tj
max=150
C
80% of
Rated
BV, Tj
max=150
C
150 C
130 C,
85% RH,
Vds=42V
Delta
100C, 5
min on,
3.5 min
off
260C
-65 C to
150 C, 30
min/
cycles
Standard
JESD22-
A108
JESD22-
A108
JESD22-
A103
JESD22-
A110
MIL-STD-
750-1036
JESD22-
B106
JESD22-
A104
Device
Name
Lot No.
Duration
1000hrs
1000hrs
1000hrs
96hrs
6000
cycles
10sec
500
cycles
FDH50N50_F133
Q20120259AA
Result/FA
0/77
0/77
0/77
0/77
0/77
0/30
0/77
FDH50N50_F133
Q20120259AB
Result/FA
0/77
0/77
0/77
0/77
0/77
0/30
0/77
FDH50N50_F133
Q20120259AC
Result/FA
0/77
0/77
0/77
0/77
0/77
0/30
0/77
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