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FCH47N60-F133 View Datasheet(PDF) - Fairchild Semiconductor

Part NameDescriptionManufacturer
FCH47N60-F133 DESIGN/PROCESS CHANGE NOTIFICATION Fairchild
Fairchild Semiconductor Fairchild
FCH47N60-F133 Datasheet PDF : 14 Pages
First Prev 11 12 13 14
Qualification Plan
Q20120273
Device
FCPF190N60
Package
TF22S003
Process
SuperFET2 600V TO220F
No. of Lots
1
Reliability Test
HTGB
HTRB
HTSL
HAST
PRCL
RSDH
TMCL
Condition
100 % Rated VGS, Tj max=150C
80% of Rated BV, Tj max=150C
150 C
130 C, 85% RH, Vds=42V
Delta 100C, 2 min on, 3.5 min off
260C
-65 C to 150 C, 30 min/ cycles
Standard
JESD22-A108
JESD22-A108
JESD22-A103
JESD22-A110
MIL-STD-750-1036
JESD22-B106
JESD22-A104
Device Name
Lot No.
Duration
1000hrs
1000hrs
1000hrs
96hrs
8572 cycles
10 sec
500 cycles
FCPF190N60
Q20120273AA
Result/FA
0/77
0/77
0/77
0/77
0/77
0/30
0/77
Qualification Plan
Q20120277
Device
FDD6N50TM
Package
TT252002
Process
UniFET1 300-500V/Dpak Ipak
No. of Lots
1
Reliability
Test
PRECON
HTGB
HTRB
HTSL
HAST
PRCL
RSDH
TMCL
Condition
Standard
L1 260’C
100 % Rated VGS, Tj
max=150C
80% of Rated BV, Tj max=150C
150 C
130 C, 85% RH, Vds=42V
Delta 100C, 2 min on, 3.5 min
off
260C
-65 C to 150 C, 30 min/ cycles
JESD22-A113
JESD22-A108
JESD22-A108
JESD22-A103
JESD22-A110
MIL-STD-750-
1036
JESD22-B106
JESD22-A104
Device Name
Lot No.
Duration
5 Cycles 24
hrs
1000hrs
1000hrs
1000hrs
96hrs
10000 cycles
10 sec
500 cycles
FDD6N50TM
Q20120277AA
Result/FA
0/154
0/77
0/77
0/77
0/77
0/77
0/30
0/77
11 of 14
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