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74ALVC08PW View Datasheet(PDF) - NXP Semiconductors.

Part Name
Description
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74ALVC08PW
NXP
NXP Semiconductors. NXP
74ALVC08PW Datasheet PDF : 14 Pages
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Nexperia
74ALVC08
Quad 2-input AND gate
VI 90 %
tW
negative
pulse
VM
10 %
0V
tf
VI
positive
pulse
tr
90 %
VM
10 %
0V
tW
VI
G
VCC
VO
DUT
RT
VM
tr
tf
VM
VEXT
RL
CL
RL
001aae331
Test data is given in Table 9.
Definitions test circuit:
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
CL = Load capacitance including jig and probe capacitance.
RL = Load resistance.
VEXT = Test voltage for switching times.
Figure 8. Test circuit for measuring switching times
Table 9. Test data
Supply voltage
VCC
1.65 V to 1.95 V
2.3 V to 2.7 V
2.7 V
3.0 V to 3.6 V
Input
VI
VCC
VCC
2.7 V
2.7 V
tr, tf
≤ 2.0 ns
≤ 2.0 ns
≤ 2.5 ns
≤ 2.5 ns
Load
CL
30 pF
30 pF
50 pF
50 pF
RL
1 kΩ
500 Ω
500 Ω
500 Ω
VEXT
tPLH, tPHL
open
open
open
open
tPLZ, tPZL
2 × VCC
2 × VCC
6V
6V
tPHZ, tPZH
GND
GND
GND
GND
74ALVC08
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 3 — 5 October 2017
© Nexperia B.V. 2017. All rights reserved.
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