datasheetbank_Logo
Integrated circuits, Transistor, Semiconductors Search and Datasheet PDF Download Site

74HCT174-Q100 View Datasheet(PDF) - NXP Semiconductors.

Part Name
Description
View to exact match
74HCT174-Q100 Datasheet PDF : 16 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
NXP Semiconductors
74HC174-Q100; 74HCT174-Q100
Hex D-type flip-flop with reset; positive-edge trigger
Table 8. Measurement points
Type
Input
VI
74HC174-Q100
VCC
74HCT174-Q100
3V
VM
0.5VCC
1.3 V
Output
VM
0.5VCC
1.3 V
tW
VI 90 %
negative
pulse
VM
10 %
0V
tf
VI
positive
pulse
tr
90 %
VM
10 %
0V
tW
VM
tr
tf
VM
VI
G
VCC
VO
DUT
RT
VCC
RL S1
CL
open
001aad983
Fig 8.
Test data is given in Table 9.
Definitions for test circuit:
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
CL = Load capacitance including jig and probe capacitance.
RL = Load resistance.
S1 = Test selection switch
Test circuit for measuring switching times
Table 9. Test data
Type
Input
VI
tr, tf
74HC174-Q100
VCC
6 ns
74HCT174-Q100
3V
6 ns
Load
CL
15 pF, 50 pF
15 pF, 50 pF
RL
1 k
1 k
S1 position
tPHL, tPLH
open
open
74HC_HCT174_Q100
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 1 — 17 April 2013
© NXP B.V. 2013. All rights reserved.
10 of 16
 

Share Link: 

datasheetbank.com [ Privacy Policy ] [ Request Datasheet ] [ Contact Us ]