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74AHC2G126 View Datasheet(PDF) - NXP Semiconductors.

Part NameDescriptionManufacturer
74AHC2G126 Dual buffer/line driver; 3-state NXP
NXP Semiconductors. NXP
74AHC2G126 Datasheet PDF : 15 Pages
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NXP Semiconductors
74AHC2G126; 74AHCT2G126
Dual buffer/line driver; 3-state
VI 90 %
tW
negative
pulse
VM
10 %
0V
tf
VI
positive
pulse
tr
90 %
VM
10 %
0V
tW
VM
tr
tf
VM
VI
G
VCC
VO
DUT
RT
VCC
RL S1
CL
open
001aad983
Fig 8.
Test data is given in Table 10.
Definitions test circuit:
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
CL = Load capacitance including jig and probe capacitance.
RL = Load resistance.
S1 = Test selection switch.
Test circuit for measuring switching times
Table 10. Test data
Type
Input
VI
74AHC2G126
VCC
74AHCT2G126 3 V
tr, tf
3 ns
3 ns
Load
CL
15 pF, 50 pF
15 pF, 50 pF
RL
1 k
1 k
S1 position
tPHL, tPLH
open
open
tPZH, tPHZ
GND
GND
tPZL, tPLZ
VCC
VCC
74AHC_AHCT2G126_4
Product data sheet
Rev. 04 — 27 April 2009
© NXP B.V. 2009. All rights reserved.
9 of 15
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