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74ABT126D View Datasheet(PDF) - NXP Semiconductors.

Part Name
Description
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74ABT126D
NXP
NXP Semiconductors. NXP
74ABT126D Datasheet PDF : 15 Pages
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Philips Semiconductors
74ABT126
Quad buffer; 3-state
VI
negative
pulse
0V
90 %
VI
positive
pulse
0V
10 %
tW
VM
10 %
tTHL(tf)
tTLH(tr)
90 %
VM
tW
VM = 1.5 V.
a. Input pulse definition
90 %
VM
tTLH(tr)
tTHL(tf)
VM
10 %
001aac221
VCC
VI
PULSE
GENERATOR
VO
D.U.T.
RT
VEXT
RL
CL
RL
mna616
Test data is given in Table 9.
Definitions test circuit:
RL = Load resistor.
CL = Load capacitance including jig and probe capacitance.
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
VEXT = Test voltage for switching times.
b. Test circuit
Fig 6. Load circuitry for switching times
Table 9: Test data
Input
VI
fi
3.0 V 1 MHz
tW
500 ns
Load
tr, tf
CL
2.5 ns 50 pF
RL
500
VEXT
tPHZ, tPZH
open
tPLZ, tPZL
7.0 V
tPLH, tPHL
open
9397 750 14597
Product data sheet
Rev. 04 — 17 February 2005
© Koninklijke Philips Electronics N.V. 2005. All rights reserved.
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