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NTE2732A View Datasheet(PDF) - NTE Electronics

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NTE2732A Datasheet PDF : 6 Pages
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NTE2732A
Integrated Circuit
32K (4K x 8) NMOS UV Erasable PROM
Description:
The NTE2732A is a 32,768–bits ultraviolet erasable and electrically programmable read–only
memory (EPROM) organized as 4,096 words by 8 bits and manufactured using N–Channel Si–Gate
MOS processing. With its single +5V power supply and with an access time of 200ns, the NTE2732A
is ideal for use with high performance +5V microprocessors such as the NTE3880.
The NTE2732A has an important feature which is the separate output control, Output Enable (OE)
from the Chip Enable control (CE). The OE control eliminates bus contention in multiple bus micropro-
cessor systems.
The NTE2732A also features an standby mode which reduces the power dissipation without increas-
ing access time. The active current is 125mA while the maximum standby mode is achieved by apply-
ing a TTL–high signal to the CE input.
Features:
D Fast Access Time: 200ns Max
D 0° to +70°C Standard Temperature Range
D Single +5V Power Supply
D Low Standby Current (35mA Max)
D Inputs and Outputs TTL Compatible During Read and Program
D Completely Static
Absolute Maximum Ratings: (Note 1)
All Input or Output Voltages with respect to GND, VI . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +6 to –0.6V
Supply Voltage with respect to GND during Program, Vpp . . . . . . . . . . . . . . . . . . . . . . . +22 to –0.6V
Ambient Temperature under Bias, TA . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –10° to +80°C
Storage Temperature Range, Tstg . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65° to +125°C
Note 1. Stresses above those listed under “Absolute Maximum Ratings” may cause permanent
damage to the device. This is a stress rating only and functional operation of the device at
these or any other conditions above those indicated in the operational sections of this specifi-
cation is not implied. Exposure to absolute maximum rating conditions for extended periods
may affect device reliability.
Operating Modes:
PINS
CE
MODE
(18)
READ
VIL
STANDBY
VIH
PROGRAM
VIL
PROGRAM VERIFTY
VIL
PROGRAM INHIBIT
VIH
OE/Vpp
(20)
VIL
Don’t Care
VPP
VIL
VPP
VCC
OUTPUTS
(24)
(9 – 11, 13–17)
+5
DOUT
+5
HIGH Z
+5
DIN
+5
DOUT
+5
HIGH Z
 

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