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74ALVCH16373DL,112 View Datasheet(PDF) - NXP Semiconductors.

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Description
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74ALVCH16373DL,112
NXP
NXP Semiconductors. NXP
74ALVCH16373DL,112 Datasheet PDF : 18 Pages
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NXP Semiconductors
12. Test information
74ALVCH16373
2.5 V/3.3 V 16-bit D-type transparent latch; 3-state
VI
G
VCC
VO
DUT
RT
VEXT
RL
CL
RL
mna616
Test data is given in Table 9.
Definitions for test circuit:
RL = Load resistance.
CL = Load capacitance including jig and probe capacitance.
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
VEXT = External voltage for measuring switching times.
Fig 10. Load circuit for measuring switching times
Table 9. Test data
Supply voltage
VCC
2.3 V to 2.7 V and
< 2.3 V
2.7 V
3.0 V to 3.6 V
Input
VI
VCC
2.7 V
2.7 V
tr, tf
2.0 ns
2.5 ns
2.5 ns
Load
CL
30 pF
50 pF
50 pF
RL
500
500
500
VEXT
tPLH, tPHL
open
tPLZ, tPZL
2 VCC
tPHZ, tPZH
GND
open
open
2 VCC
2 VCC
GND
GND
74ALVCH16373
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 6 — 10 July 2012
© NXP B.V. 2012. All rights reserved.
12 of 18
 

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