datasheetbank_Logo
Integrated circuits, Transistor, Semiconductors Search and Datasheet PDF Download Site

DSOX2SGM View Datasheet(PDF) - Agilent Technologies, Inc

Part Name
Description
View to exact match
DSOX2SGM
Agilent
Agilent Technologies, Inc Agilent
DSOX2SGM Datasheet PDF : 20 Pages
1 2 3 4 5 6 7 8 9 10 Next Last
Oscilloscopes redefined: Breakthrough technology delivers more scope for the same budget
Get more investment protection with the industry’s only fully upgradable
oscilloscope
Upgradability:
Project needs change, but traditional oscilloscopes are
fixed – you get what you pay for at the time of purchase.
With the 2000 X-Series, your investment is protected. If
you need more bandwidth (up to 200 MHz), digital chan-
nels, WaveGen or measurement applications in the future,
you can easily add them all after the fact.
Add at the time of your purchase or upgrade later:
• Bandwidth
• Digital channels (MSO)
• WaveGen
• Measurement applications
◦ Mask testing
◦ Segmented memory
◦ Educators’ lab kit
Mask testing
Whether performing pass/fail tests to specified standards
in manufacturing or testing for infrequent signal anomalies
in R&D debug, the mask test option can be a valuable
productivity tool. The 2000 X-Series features the industry’s
only hardware-based mask testing and can perform up to
50,000 tests per second.
Segmented memory
When capturing low-duty cycle pulses or data bursts,
you can use segmented memory acquisition to optimize
acquisition memory. Segmented memory acquisition lets
you selectively capture and store important segments of
signals without capturing unimportant signal idle/dead-
time. Segmented memory acquisition is ideal for applica-
tions including packetized serial pulses, pulsed laser, radar
bursts and high-energy physics experiments. Up to 25
segments can be captured on the 2000 X-Series models
with a minimum re-arm time under 19 µs.
6
 

Share Link: 

datasheetbank.com [ Privacy Policy ] [ Request Datasheet ] [ Contact Us ]