M52778SP View Datasheet(PDF) - Renesas Electronics
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M52778SP Datasheet PDF : 37 Pages
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MITSUBISHI ICs (TV)
M52778SP
VIF, SIF, VIDEO, CHROMA, DEFLECTION FOR PAL/NTSC
ELECTRICAL CHARACTERISTICS TEST METHOD
P/N Video S/N
1. Input SG3 and measure the rms value of output signal at pin 52.
2. P/N is defined as follows:
P/N=20log V0NEG measured value (VP-P) ×103×0.7
Measured value (mVrms)
(dB)
BW Video frequency characteristics
1. Input SG4 and set the frequency f2 to 37.9MHz so that the beat
element of 1MHz is output to pin 52.
2. Then set the applied voltage at pin 4 so that the beat element of
1MHz at pin 52 may be 100dBµ.
3. Decrease f2 to the level at which the beat element becomes 3dB
smaller than the element of 1MHz, and read the value at that
level.
P52 100dBµ
3dB
1MHz
BW
IM Intermodulation
1. Adjust the applied voltage at pin 4 so that the lowest output
signal voltage at pin 52 is 2.2V.
P52
2.2V
2. Measure elements of 1.07MHz and 4.43MHz of output at pin 52.
3. IM is defined as follows:
IM=20log Element of 1.07MHz (dB)
Element of 4.43MHz
ATT Maximum attenuation
1. Measure the element of 400Hz of output at pin 46.
2. ATT=20log
V0AFmax
Measured value
(dB)
LIM Input limiting sensitivity
Decrease the input level of SG 18. Measure the input level when the
element of 400Hz at pin 46 is 3dB smaller than V0AFM (S6:
Maximum AF output (6.0M)).
Vin min. Input sensitivity
1. Decrease SG5 level until the video detector output is 3dB
smaller then the measured value of Parameter V3 “Video
detector output”.
Vin max. Maximum permissible input
1. Input 90dBu SG6.
2. VA is the output level at pin 52. Increase SG6 voltage until the
output at pin 52 becomes 3dB smaller than VA. The input levell at
that time is the maximum permissible input.
µAFTN AFT detector sensitivity (NEG)
V1HN Maximum AFT voltage (NEG)
V1LN Minimum AFT voltage (NEG)
See the following figure.
P1 V1HN
∆f
5.0V
3.0V
V1LN
37.9Mz
f0
39.9MHz
f
µAFTN is defined as follows:
µAFTN=
(5.0-3.0)×103mV (mV/kHz)
∆f kHz
AMR
1. Vam is the element of 400Hz at pin 46.
2. AMR is defined as follows:
AMR=20log
V0AFS (mVrms)
Vam (mVrms)
(dB)
AF S/N
1. Measure the noise (20Hz to 100kHz) of output at pin 46.
2. AF S/N is defined as follows:
AF S/N=20log
V0AFmax
(dB)
Measured value
GEAu EXT Audio GAIN
Input SG22 at pin 47, and measure the output VP-P at pin 46.
GAIN=20log
Input signal VP-P
Output signal VP-P (pin46)
(dB)
Cn1 Output signal amplitude 1 (PAL)
Cn2 Output signal amplitude 2 (PAL)
1. Input SS4P to VI IN.
2. Measure output amplitude, Cn1 and Cn2, at pins 41 and 43
respectively.
12
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