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74LVC08ATTR View Datasheet(PDF) - STMicroelectronics

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74LVC08ATTR Datasheet PDF : 11 Pages
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74LVC08A
Table 7: Dynamic Switching Characteristics
Test Condition
Value
Symbol
Parameter
VOLP
VOLV
Dynamic Low Level Quiet
Output (note 1)
VCC
TA = 25 °C
Unit
(V)
Min. Typ. Max.
3.3
CL = 50pF
VIL = 0V, VIH = 3.3V
0.8
-0.8
V
1) Number of output defined as "n". Measured with "n-1" outputs switching from HIGH to LOW or LOW to HIGH. The remaining output is
measured in the LOW state.
Table 8: AC Electrical Characteristics
Test Condition
Value
Symbol
Parameter
VCC
CL
RL ts = tr -40 to 85 °C
-55 to 125 °C Unit
(V)
(pF) () (ns) Min. Max. Min. Max.
tPLH tPHL Propagation Delay 1.65 to 1.95 30 1000 2.0
9.0
Time
2.3 to 2.7 30 500 2.0
6.0
2.7
50 500 2.5
4.8
12
8.0
ns
5.8
3.0 to 3.6 50 500 2.5
1
4.1
1
5.0
tOSLH
tOSHL
Output To Output
Skew Time (note1,
2)
2.7 to 3.6
1
1
ns
1) Skew is defined as the absolute value of the difference between the actual propagation delay for any two outputs of the same device switch-
ing in the same direction, either HIGH or LOW (tOSLH = | tPLHm - tPLHn|, tOSHL = | tPHLm - tPHLn|
2) Parameter guaranteed by design
Table 9: Capacitive Characteristics
Test Condition
Value
Symbol
Parameter
VCC
(V)
CIN Input Capacitance
CPD Power Dissipation Capacitance
1.8
(note 1)
2.5
3.3
fIN = 10MHz
TA = 25 °C
Unit
Min. Typ. Max.
4
pF
33
36
pF
38
1) CPD is defined as the value of the IC’s internal equivalent capacitance which is calculated from the operating current consumption without
load. (Refer to Test Circuit). Average operating current can be obtained by the following equation. ICC(opr) = CPD x VCC x fIN + ICC/n (per circuit)
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