datasheetbank_Logo
Integrated circuits, Transistor, Semiconductors Search and Datasheet PDF Download Site

74HC244 View Datasheet(PDF) - ON Semiconductor

Part Name
Description
View to exact match
74HC244 Datasheet PDF : 7 Pages
1 2 3 4 5 6 7
DEVICE
UNDER
TEST
TEST POINT
OUTPUT
CL*
*Includes all probe and jig capacitance
Figure 3. Test Circuit
74HC244
TEST CIRCUITS
DEVICE
UNDER
TEST
TEST POINT
OUTPUT
1 kW
CL*
CONNECT TO VCC WHEN
TESTING tPLZ AND tPZL.
CONNECT TO GND WHEN
TESTING tPHZ AND tPZH.
*Includes all probe and jig capacitance
Figure 4. Test Circuit
PIN DESCRIPTIONS
INPUTS
A1, A2, A3, A4, B1, B2, B3, B4
(Pins 2, 4, 6, 8, 11, 13, 15, 17)
Data input pins. Data on these pins appear in noninverted
form on the corresponding Y outputs, when the outputs are
enabled.
CONTROLS
Enable A, Enable B (Pins 1, 19)
Output enables (activelow). When a low level is applied
to these pins, the outputs are enabled and the devices
function as noninverting buffers. When a high level is
applied, the outputs assume the high impedance state.
OUTPUTS
YA1, YA2, YA3, YA4, YB1, YB2, YB3, YB4
(Pins 18, 16, 14, 12, 9, 7, 5, 3)
Device outputs. Depending upon the state of the
outputenable pins, these outputs are either noninverting
outputs or highimpedance outputs.
LOGIC DETAIL
TO THREE OTHER
A OR B INVERTERS
DATA
INPUT
A OR B
ONE OF 8
INVERTERS
VCC
YA
OR
YB
ENABLE A OR
ENABLE B
http://onsemi.com
5
 

Share Link: 

datasheetbank.com [ Privacy Policy ] [ Request Datasheet ] [ Contact Us ]