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BAS28 View Datasheet(PDF) - NXP Semiconductors.

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Description
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BAS28
NXP
NXP Semiconductors. NXP
BAS28 Datasheet PDF : 12 Pages
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NXP Semiconductors
8. Test information
BAS28
High-speed double diode
RS = 50 Ω
V = VR + IF × RS
D.U.T.
IF
SAMPLING
OSCILLOSCOPE
Ri = 50 Ω
VR
mga881
tr
tp
10 %
90 %
input signal
(1) IR = 1 mA
Fig 6. Reverse recovery time test circuit and waveforms
t
+ IF
trr
t
(1)
output signal
I
1 kΩ
450 Ω
RS = 50 Ω
D.U.T.
OSCILLOSCOPE
Ri = 50 Ω
I
90 %
10 %
tr
tp
input signal
Fig 7. Forward recovery voltage test circuit and waveforms
V
VFR
t
t
output signal
mga882
8.1 Quality information
This product has been qualified in accordance with the Automotive Electronics Council
(AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is
suitable for use in automotive applications.
BAS28
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 3 — 22 July 2010
© NXP B.V. 2010. All rights reserved.
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