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FDPF5N50NZFT_ View Datasheet(PDF) - Fairchild Semiconductor

Part Name
Description
View to exact match
FDPF5N50NZFT_
Fairchild
Fairchild Semiconductor Fairchild
FDPF5N50NZFT_ Datasheet PDF : 0 Pages
First Prev
Qualification
Plan
Q20130023
Device
Package Process
FGPF4633TU
TF22S003
PDP 4GEN Trench IGBT 330V_360V
TO220F
No. of
Lots
3
Reliability
Test
HTGB
HTRB
HTSL
HAST
PRCL
RSDH
TMCL
Condition
Standard
100 % Rated
VGS, Tj
max=150C
80% of Rated
BV, Tj
max=150C
150 C
130 C, 85%
RH, Vds=42V
Delta 100C, 2
min on, 3.5 min
off
260C
-65 C to 150 C,
30 min/ cycles
JESD22-
A108
JESD22-
A108
JESD22-
A103
JESD22-
A110
MIL-STD-
750-1036
JESD22-
B106
JESD22-
A104
Device
Name
Lot No.
Duration
1000hrs
1000hrs
1000hrs
96hrs
8572
cycles
10 sec
500
cycles
FGPF4633TU FGPF4633TU FGPF4633TU
Q20130023AA Q20130023AB Q20130023AC
Result/FA
Result/FA
Result/FA
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/77
0/30
0/30
0/30
0/77
0/77
0/77
Qualification Plan
Q20130024
Device
FCP20N60
Package
TO220003
Process
Super-FET 600V TO220
No. of Lots
1
Reliability Test
HTGB
HTRB
HTSL
HAST
PRCL
RSDH
TMCL
Condition
100 % Rated VGS, Tj max=150C
80% of Rated BV, Tj max=150C
150 C
130 C, 85% RH, Vds=42V
Delta 100C, 2 min on, 3.5 min off
260C
-65 C to 150 C, 30 min/ cycles
Standard
JESD22-A108
JESD22-A108
JESD22-A103
JESD22-A110
MIL-STD-750-1036
JESD22-B106
JESD22-A104
Device Name
Lot No.
Duration
1000hrs
1000hrs
1000hrs
96hrs
8572 cycles
10 sec
500 cycles
FCP20N60
Q20130024AA
Result/FA
0/77
0/77
0/77
0/77
0/77
0/30
0/77
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