datasheetbank_Logo
Integrated circuits, Transistor, Semiconductors Search and Datasheet PDF Download Site

1EDI30J12CPXUMA1 View Datasheet(PDF) - Unspecified

Part Name
Description
View to exact match
1EDI30J12CPXUMA1
ETC
Unspecified ETC
1EDI30J12CPXUMA1 Datasheet PDF : 28 Pages
First Prev 11 12 13 14 15 16 17 18 19 20 Next Last
EiceDRIVER™ Enhanced
1EDI30J12CP
Characteristics
4
Characteristics
Unless otherwise noticed, voltages of the input side signals (pins VCC1, IN, EN, GND1) are measured with respect
to input ground (pin GND1), all other voltages are measured with respect to positive output supply (pin VCC2).
Currents in the following tables are defined as positive currents flowing out of the pin (unless otherwise specified).
The voltage levels are valid if other ratings are not violated.
4.1
Absolute Maximum Ratings
Absolute maximum ratings are listed in Table 2. Stresses above the max. values may cause permanent damage
to the device. Exposure to absolute maximum rating conditions for extended periods may affect device reliability.
Maximum ratings are absolute ratings; exceeding only one of these values may cause irreversible damage to the
integrated circuit.
For the same reason make sure that any capacitors that will be connected to pins VCC1 and VCC2 are discharged
before assembling the application circuit.
Table 2 Absolute Maximum Ratings
Parameter
Symbol Limit Values
Unit Remarks
Min.
Max.
Positive supply voltage input side
Voltage at pin IN, EN
Input to output isolating voltage
Negative supply voltage output side
(VEE2)
VVCC1
VIN
VISO
VVEE2
-0.3
18 V
-0.3
VVCC1+0.3 V
-1200
+1200 V
1)
-30
VVCC2+0.3 V
Voltage at pin BSEN
VBSEN
VVREG-0.3 VVCC2+0.3 V
Voltage at pin VREG
VVREG
-21
VVCC2+0.3 V
VEE2 max dV/dt
|dVVEE2|
125
V/ms CVReg= 2.2µF
Voltage at pin JFDrv
VJFDrv
VVREG-0.3 VVCC2+0.3 V
Voltage at pin MDrv
VMDrv
VVREG-0.3 VVCC2+0.3 V
Junction temperature
TJ
-40
150 °C
Storage temperature
TS
-55
150
°C
2)3)
Maximum power dissipation
ESD capability
PTOT
VESD
1.0
W PG-DSO-19-4, TA=25°C
2
kV Human Body Model4)
1) With reference to GND1
2) Prolonged storage at high temperatures reduces the lifetime of the product
3) Tested according to EIA/JESD22-A103D
4) According to EIA/JESD22-A114-B (discharging at 100pF Capacitor through 1.5kΩ Resistor)
Preliminary Datasheet
14
Rev. 1.3, 2014-11-12
 

Share Link: 

datasheetbank.com [ Privacy Policy ] [ Request Datasheet ] [ Contact Us ]