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0402BW390G251SX024HW View Datasheet(PDF) - Unspecified

Part NameDescriptionManufacturer
0402BW390G251SX024HW High Reliability Chip - C0G 16Vdc to 10kVdc ETC
Unspecified 
0402BW390G251SX024HW Datasheet PDF : 10 Pages
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Lot Test Details
DPA
Destructive Physical Analysis, Device is mounted in an epoxy plug and cross sectioned, with a fine grit sand paper while
examining the internal construction of the device per relevant sections of EIA 469 and NOVACAP’s internal design criteria.
CSAM
C-Mode Scanning Acoustic Microscopy; A method of non-destructive analysis is of the internal construction of a device per
MIL-PRF-123. The optional test is to assure the highest quality of internal microstructure.
Plating Thickness
Verification
X-Ray fluorescent [XRF) equipment/instrument is utilized to verily the plating thickness of a device according to NOVACAP’s
criteria.
Solderability
Determines the ability for solder to wet/adhere to the termination by dipping the component into molten solder according to
MIL-STD-202 Method 208.
Electrical Characteristics
(DWV, IR, Cap, DF)
Sample Visual
Inspection
DWV: Dielectric Withstanding Voltage, Determines the ability of the dielectric to withstand accelerated voltage without
breaking down.
IR: Insulation Resistance; The insulation resistance is a measure of the capability of a material To withstand leakage of current
under a VDC potential gradient.
Is an AQL level inspection, which is based on lot size and consists of a bulk scan under microscope between 7-10X
magnification.
100% Visual Inspection
Each side of every part in a lot is subjected to inspection under microscope between 7-10X magnification in accordance with
MIL-PRF-123 Appendix B.
Thermal Shock
-55°C to +125°C
Devices are subjected to sudden temperature extremes (hot and cold) to determine the physical integrity of the components.
All parts receive 20 cycles in accordance with MIL-PRF-123.
100% Burn-In
100% Hot IR
Hot IR sample test
A method of screening infantile failures by testing at accelerated conditions.
Product groups HB and HK follow the guidelines of MIL-PRF-55681. The parts receive a 100% Burn-in at 125°C and a voltage
specified in page 27 for 100 hours.
Product group HS follows the guidelines of MIL-PRF-123. The parts receive a 100% Bum-in at 125°C and a voltage specified in
page 27 for a minimum of 168 and a maximum of 264 hours. The Burn-In may be terminated at any time between the hours
of 168 and 264 when failures are less than 0.1% or 1 pieces during the last 48 hours of the test.
Tested for IR at rated voltage and elevated temperatures.
A sample that is tested for IR at rated voltage and elevated temperatures.
10 Piece Sample Temp
Cycling, Constant
Acceleration, Burn-In
The 10 piece sample is tested in accordance with MIL-PRF-38534 TABLE C-lll Subgroup 3. The tests include Temperature
Cycling per MIL-STD-883 Method 1010 Condition C, Constant Acceleration per MIL-STD-883 Method 2001 with 3,000g’s in
Y1 direction, Burn-in according to MIL-PRF-55681, and Visual inspection.
Life Sample Test
Humidity Sample Test
A test that determines the long-term reliability of a device that is performed at accelerated electrical and environ mental
conditions. Life test for product groups HH,HB, and HK shall be in accordance with MIL PRF-55681. Life test for product group
HS shall be in accordance with MlL-PRF-123.
Humidity, steady state, low voltage test in accordance with MIL-PRF-202 method 103 condition A with the capacitor
requirements of MIL-PRF-55681/MIL-PRF-123. A twelve piece sample is tested with accept on zero failures.
Resistance to Soldering
Heat Sample Test
The ability of a device to withstand soldering temperatures. Capacitors shall be tested in accordance with MIL-STD-202 Method
210 with applicable detail of MIL-PRF-55681/MIL-PRF-123.
Terminal Strength
Sample Test
Group B Testing
It is the strength of the adhesion of the termination to the ceramic body. Capacitors shall be tested in accordance with MIL-
STD-202 Method 211 Test Condition A with applicable details of MlL-PRF-123. A six piece sample is tested with accept on zero
failures.
Group B environmental testing for product group HS shall consist of the tests specified in table XII of MIL-PRF-123 and shall
be performed on sample units from lots that have been subjected to and have passed group A inspection. Copies of Group B
data shall be forwarded to purchaser with parts.
Parts may not be shipped until the conclusion of life test.
Group C Testing
Group C environmental testing shall consist of the tests specified in table XI of MIL-PRF-55681 for product groups HB and HK.
Testing shall consist of the tests specified in table XIII of MIL-PRF-123 for product group HS. Tests shall be performed on sample
units from lots that have been subjected to and have passed group A inspection. Copies of Group C data shall be forwarded to
purchaser with parts. Parts may not be shipped until the conclusion of life test.
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