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TS68C429AVF1B_C View Datasheet(PDF) - Atmel Corporation

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TS68C429AVF1B_C Datasheet PDF : 43 Pages
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Quality Conformance
Inspection
DESC/MIL-STD-883
Is in accordance with MIL-M-38510 and method 5005 of MIL-STD-883. Group A and B
inspections are performed on each production lot. Group C and D inspections are per-
formed on a periodic basis.
Electrical
Characteristics
General Requirements
All static and dynamic electrical characteristics specified for inspection purposes and the
relevant measurement conditions are given below:
• Table 4, Table 5: Static electrical characteristics for the electrical variants.
• Table 6, Table 7, Table 8: Dynamic electrical characteristics.
For static characteristics (Table 4, Table 5), test methods refer to IEC 748-2 method
number, where existing.
For dynamic characteristics (Table 6, Table 7, Table 8), test methods refer to clause 5.5
of this specification.
Table 4. DC Electrical Characteristics
With -55°C Tcase +125°C or -40° Tcase +85°C; VCC = 5V ± 10%.
Symbol
Parameter
Min
Max
Unit
VIH
Input High Voltage
2.25
VCC + 0.3
V
VIL
Input Low Voltage
-0.5
0.8
V
VOH
Output High Voltage (except IRQRX, IRQTX: open drain outputs)
2.7
V
VOL
Output Low Voltage
0.5
V
IOH
Output Source Current (except IRQRX,
IRQTX: open drain outputs)
(Vout = 2.7V)
-8
mA
IOL
Output Sink Current
(Vout = 0.5V)
8
mA
ILI
Input Leakage Current
(Vin = 0 to VCC)
±20
µA
IDD
Dynamic Current(1)
(Tcase = Tmin VDD
= Vmax)
65
mA
Note: 1. IDD is measured with all I/O pins at 0V, all input pins at 0V except signals CS, IACKxx, LDS, UDS at 5V and CLK-SYS and
CLK-ARINC which run at tcyc mini.
Table 5. Capacitance (TA = 25°C)
Symbol
Parameter
Max
Unit
Cin
Input Capacitance
10
pF
Cout
HI-Z Output Capacitance
20
pF
10 TS68C429A
2120A–HIREL–08/02
 

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