Absolute Maximum Ratings (Ta = 25°C)
Power dissipation (Ta = 25°C)
Single pulse active clamp capability
Active clamp current
Repetitive active clamp capability
Storage temperature range
150 (Note 3) °C
Note 1: Active clamp capability (single pulse) test condition
VDD = 25 V, Starting Tch = 25°C, L = 10 mH, IAR = 1.5 A, RG = 25 Ω
Note 2: Repetitive rating; pulse width limited by maximum channel temperature.
Note 3: Overtemperature protection will work when the channel temperature exceeds 125°C.
Be sure to operate the device in such a way that the channel temperature does not exceed 125°C.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly
even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute
maximum ratings and the operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test
report and estimated failure rate, etc).
Thermal resistance, channel to ambient