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28F004S5 View Datasheet(PDF) - Intel

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28F004S5 Datasheet PDF : 37 Pages
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BYTE-WIDE SMART 5 FlashFile™ MEMORY FAMILY
E
6.2.4
COMMERCIAL TEMPERATURE AC CHARACTERISTICS - READ-ONLY OPERATIONS(1)
Commercial Temperature Read-Only Operations for
4-, 8-, and 16-Mbit Smart 5 FlashFile™ Memories at TA = 0°C to +70°C
5V ± 5% VCC –85/–95(5)
Versions(4)
5V ± 10% VCC
–90/–100(6)
–120(6)
# Sym
Parameter
Notes Min Max Min Max Min Max Unit
R1 tAVAV Read Cycle Time
4, 8 Mbit
85
90
120
ns
16 Mbit
95
100
120
ns
R2 tAVQV Address to Output 4, 8 Mbit
85
90
120 ns
Delay
16 Mbit
95
100
120 ns
R3 tELQV CE# to Output Delay 4, 8 Mbit 2
85
90
120 ns
16 Mbit
2
95
100
120 ns
R4 tGLQV OE# to Output Delay
2
40
45
50 ns
R5 tPHQV RP# High to Output Delay
400
400
400 ns
R6 tELQX CE# to Output in Low Z
30
0
0
ns
R7 tGLQX OE# to Output in Low Z
30
0
0
ns
R8 tEHQZ CE# High to Output in High Z
3
55
55
55 ns
R9 tGHQZ OE# High to Output in High Z
3
10
10
15 ns
R10 tOH
Output Hold from Address, CE#
3
0
0
0
ns
or OE# Change, Whichever
Occurs First
NOTES:
1. See AC Input/Output Reference Waveform for maximum allowable input slew rate.
2. OE# may be delayed up to tELQV-tGLQV after the falling edge of CE# without impact on tELQV.
3. Sampled, not 100% tested.
4. See Ordering Information for device speeds (valid operational combinations).
5. See Transient Input/Output Reference Waveform and Transient Equivalent Testing Load Circuit (High Speed
Configuration) for testing characteristics.
6. See Transient Input/Output Reference Waveform and Transient Equivalent Testing Load Circuit (Standard Configuration)
for testing characteristics.
30
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