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ST10F272Z2Q3 View Datasheet(PDF) - STMicroelectronics

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ST10F272Z2Q3 Datasheet PDF : 179 Pages
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Internal Flash memory
ST10F272
5.5.3 Flash non volatile access protection register 0
5.5.4
FNVAPR0 (0x08 DFB8)
NVR
Reset value: ACFFh
15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0
reserved
DBGP ACCP
RW RW
Table 20.
Bit
ACCP
DBGP
Flash non volatile access protection register 0
Function
Access Protection
This bit, if programmed at 0, disables any access (read/write) to data mapped
inside IFlash Module address space, unless the current instruction is fetched from
IFlash.
Debug Protection
This bit, if erased at 1, allows to by-pass all the protections using the Debug
features through the Test Interface. If programmed at 0, on the contrary, all the
debug features, the Test Interface and all the Flash Test Modes are disabled. Even
STMicroelectronics will not be able to access the device to run any eventual failure
analysis.
Flash non volatile access protection register 1 low
FNVAPR1L (0x08 DFBC)
NVR
Delivery value:: FFFFh
15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0
PDS15 PDS14 PDS13 PDS12 PDS11 PDS10 PDS9 PDS8 PDS7 PDS6 PDS5 PDS4 PDS3 PDS2 PDS1 PDS0
RW RW RW RW RW RW RW RW RW RW RW RW RW RW RW RW
Table 21.
Bit
PDS(15:0)
Flash non volatile access protection register 1 low
Function
Protections Disable 15-0
If bit PDSx is programmed at 0 and bit PENx is erased at 1, the action of bit ACCP
is disabled. Bit PDS0 can be programmed at 0 only if both bits DBGP and ACCP
have already been programmed at 0. Bit PDSx can be programmed at 0 only if bit
PENx-1 has already been programmed at 0.
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