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SMP100-200 View Datasheet(PDF) - STMicroelectronics

Part NameDescriptionManufacturer
SMP100-200 COMMUNICATION EQUIPMENT PROTECTION: TRISIL™ ST-Microelectronics
STMicroelectronics ST-Microelectronics
SMP100-200 Datasheet PDF : 9 Pages
1 2 3 4 5 6 7 8 9
TEST CIRCUIT 2 for IH parameter.
SMP100-xxx
R
VBAT = - 48 V
D.U.T.
- VP
Surge generator
This is a GO-NO GO test which allows to confirm the holding current (IH) level in a functional test circuit.
TEST PROCEDURE :
- Adjust the current level at the IH value by short circuiting the D.U.T.
- Fire the D.U.T. with a surge current : Ipp = 10A, 10/1000 µs.
- The D.U.T. will come back to the off-state within 50 ms max.
TEST CIRCUITS 3 FOR VBO DYNAMIC PARAMETERS
100 V / µs, di/dt < 10 A / µs, Ipp = 100 A
2
U
10 µF
45
66 470
83
0.36 nF
46 µH
KeyTek ’System 2’ generator with PN246I module
1 kV / µs, di/dt < 10 A / µs, Ipp = 10 A
26 µH
250
47
U
60 µF
12
46 µH
KeyTek ’System 2’ generator with PN246I module
5/9
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