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SAA7115 View Datasheet(PDF) - Philips Electronics

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Description
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SAA7115 Datasheet PDF : 214 Pages
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Philips Semiconductors
CS-PD Hamburg
CVIP2
Datasheet
SAA7115
Date:
Version:
10/23/01
0.67
SYMBOL
PIN
I/O/P DESCRIPTION
TCK
98
I Test Clock for Boundary Scan Test (with internal pull-up)(2)
TMS
99
I Test Mode Select for Boundary Scan Test or Scan Test (with internal pull-up)(2)
VSSE
100
P digital ground (external pad supply)
Notes
1. This pin provides easy initialization of BST circuitry. TRSTN can be used to force the TAP (Test Access Port)
controller to the Test-Logic-Reset state (normal operation) at once
2. According to the IEEE1149.b1-1994 standard the pads TDI and TMS are input pads with a internal pull-up transistor
and TDO a tri-state output pad. TCK, TRSTN are also build with internal pull_up
Confidential - NDA required
Filename: SAA7115_Datasheet.fm
page 17
Last edited by H. Lambers
 

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