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QVE00033 View Datasheet(PDF) - Fairchild Semiconductor

Part Name
Description
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QVE00033 Datasheet PDF : 6 Pages
1 2 3 4 5 6
Absolute Maximum Ratings (TA = 25°C unless otherwise specified)
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Symbol
Parameter
TOPR
TSTG
TSOL-I
TSOL-F
P TOT
EMITTER
IF
VR
PD
SENSOR
VCEO
VECO
IC
PD
Operating Temperature
Storage Temperature
Soldering Temperature (Iron)(2,3,4)
Soldering Temperature (Flow)(2,3)
Total Power Dissipation
Continuous Forward Current
Reverse Voltage
Power Dissipation(1)
Collector-Emitter Voltage
Emitter-Collector Voltage
Collector Current
Power Dissipation(1)
Notes:
1. Derate power dissipation linearly 1.00mW/°C above 25°C.
2. RMA flux is recommended.
3. Methanol or isopropyl alcohols are recommended as cleaning agents.
4. Soldering iron tip 1/16" (1.6mm) from housing.
Rating
-55 to +100
-55 to +100
240 for 5 sec.
260 for 10 sec.
100
50
6
75
30
4.5
20
75
Units
°C
°C
°C
°C
mW
mA
V
mW
V
V
mA
mW
Electrical/Optical Characteristics (TA = 25°C unless otherwise specified)
Symbol Parameter
Test Conditions
Min. Typ.
EMITTER
VF
Forward Voltage
IF = 20mA
1.2
IR
Reverse Current
VR = 4V
lPE
Peak Emission Wavelength IF = 20mA
940
SENSOR
ICEO Dark Current
COUPLED
VCE = 20V, IF = 0mA
IC(ON)
VCE (SAT)
tr
tf
Collector Current
Collector Emitter
Rise Time
Fall Time
IF = 5mA, VCE = 5V
100
IF = 10mA, IC = 40µA
VCC = 5V, RL = 1000,
7
IC = 100µA
7
Max. Units
1.4
V
10
µA
nm
100
nA
600
µA
0.4
V
150
µs
150
µs
©2005 Fairchild Semiconductor Corporation
QVE00033 Rev. 1.1.0
2
www.fairchildsemi.com
 

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