|O1644A||Sound Plus™ High-Performance, JFET-Input AUDIO OPERATIONAL AMPLIFIERS|
|O1644A Datasheet PDF : 25 Pages |
SBOS484A – DECEMBER 2009 – REVISED APRIL 2010
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ABSOLUTE MAXIMUM RATINGS(1)
Over operating free-air temperature range (unless otherwise noted).
Supply Voltage, VS = (V+) – (V–)
Differential Input Voltage
Operating Temperature, TA
Storage Temperature, TA
Junction Temperature, TJ
Human Body Model (HBM)
ESD Ratings Charged Device Model (CDM)
Machine Model (MM)
(V–) –0.5 to (V+) +0.5
–55 to +125
–65 to +150
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not supported.
(2) Input terminals are diode-clamped to the power-supply rails. Input signals that can swing more than 0.5V beyond the supply rails should
be current-limited to 10mA or less.
(3) Short-circuit to VS/2 (ground in symmetrical dual-supply setups), one amplifier per package.
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or visit the
device product folder at www.ti.com.
Copyright © 2009–2010, Texas Instruments Incorporated
Product Folder Link(s): OPA1641 OPA1642 OPA1644
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