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NM25C040 View Datasheet(PDF) - Fairchild Semiconductor

Part Name
Description
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NM25C040 Datasheet PDF : 10 Pages
1 2 3 4 5 6 7 8 9 10
Low Voltage 2.7V VCC 4.5V Specifications
Absolute Maximum Ratings (Note 5)
Operating Conditions
Ambient Storage Temperature
All Input or Output Voltage with
Respect to Ground
Lead Temp. (Soldering, 10 sec.)
ESD Rating
-65°C to +150°C
+6.5V to -0.3V
+300°C
2000V
Ambient Operating Temperature
NM25C040L/LZ
NM25C040LE/LZE
NM25C040LV
Power Supply (VCC)
0°C to +70°C
-40°C to +85°C
-40°C to +125°C
2.7V–4.5V
DC and AC Electrical Characteristics 2.7V VCC 4.5V (unless otherwise specified)
25C040L/LE
25C040LZ/ZE
25C040LV
Symbol
ICC
ICCSB
Parameter
Operating Current
Standby Current
IIL
Input Leakage
IOL
Output Leakage
VIL
Input Low Voltage
VIH
Input High Voltage
VOL
Output Low Voltage
VOH
Output High Voltage
fOP
SCK Frequency
tRI
Input Rise Time
tFI
Input Fall Time
tCLH
Clock High Time
tCLL
Clock Low Time
tCSH
Min. CS High Time
tCSS
CS Setup Time
tDIS
Data Setup Time
tHDS
HOLD Setup Time
tCSN
CS Hold Time
tDIN
Data Hold Time
tHDN
HOLD Hold Time
tPD
Output Delay
tDH
Output Hold Time
tLZ
HOLD Output Low Z
tDF
Output Disable Time
tHZ
HOLD to Output Hi Z
tWP
Write Cycle Time
Part
L
LZ
Conditions
CS = VIL
CS = VCC
Min.
VIN = 0 to VCC
-1
VOUT = GND to VCC
-1
-0.3
IOL = 0.8 mA
IOH = –0.8 mA
VCC * 0.7
VCC - 0.8
(Note 6)
410
(Note 6)
410
(Note 7)
500
500
100
240
500
100
240
CL = 200 pF
0
CL = 200 pF
1-4 Bytes
Max.
3
10
1
1
1
VCC * 0.3
VCC + 0.3
0.4
1.0
2.0
2.0
500
240
500
240
15
Min
-1
-1
-0.3
VCC * 0.7
VCC - 0.8
410
410
500
500
100
240
500
100
240
0
Max
3
10
N/A
1
1
VCC * 0.3
VCC + 0.3
0.4
1.0
2.0
2.0
500
240
500
240
15
Units
mA
µA
µA
µA
µA
V
V
V
V
MHz
µs
µs
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ms
Capacitance TA = 25°C, f = 2.1/1 MHz (Note 8)
Symbol
Test
Typ Max Units
COUT
CIN
Output Capacitance
3
8 pF
Input Capacitance
2
6 pF
AC Test Conditions
Output Load
Input Pulse Levels
Timing Measurement Reference Level
CL = 200pF
0.1 * VCC - 0.9 * VCC
0.3 * VCC - 0.7 * VCC
Note 5: Stress above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only, and functional operation of the device
at these or any other conditions above those indicated in the operational sections of the specification is not implied. Exposure to absolute maximum rating conditions for extended
periods may affect device reliability.
Note 6: The fOP frequency specification specifies a minimum clock period of 1/fOP. Therefore, for every fOP clock cycle, tCLH + tCLL must be equal to or greater than 1/fOP. For example,
if the 2.1MHz period = 476ns and tCLH = 190ns, tCLL must be 286ns.
Note 7: CS must be brought high for a minimum of tCSH between consecutive instruction cycles.
Note 8: This parameter is periodically sampled and not 100% tested.
NM25C040 Rev. D.1
4
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