NBSG16MMNR2G View Datasheet(PDF) - ON Semiconductor

Part Name

Description

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NBSG16MMNR2G

2.5 V/3.3 VMultilevel Input to CML Clock/Data Receiver/Driver/Translator Buffer

ON Semiconductor 

NBSG16M

Table 4. MAXIMUM RATINGS

Symbol

Parameter

Condition 1

Condition 2

Rating

Unit

VCC

VEE

VI

VINPP

Positive Power Supply

Negative Power Supply

Positive Input

Negative Input

Differential Input Voltage |D − D|

VEE = 0 V

VCC = 0 V

VEE = 0 V

VCC = 0 V

VCC − VEE w 2.8 V

VCC − VEE < 2.8 V

VI v VCC

VI w VEE

3.6

V

−3.6

V

3.6

V

−3.6

V

2.8

V

|VCC − VEE|

IIN

Input Current Through RT (50 W Resistor) Static

Surge

45

mA

80

mA

Iout

Output Current

Continuous

Surge

25

mA

50

mA

IBB

VBB Sink/Source

TA

Operating Temperature Range

Tstg

Storage Temperature Range

qJA

Thermal Resistance (Junction−to−Ambient) 0 lfpm

(Note 5)

500 lfpm

QFN−16

QFN−16

1.0

−40 to +85

−65 to +150

42

35

mA

°C

°C

°C/W

°C/W

qJC

Thermal Resistance (Junction−to−Case)

1S2P (Note 5)

QFN−16

Tsol

Wave Solder

Pb <2 to 3 sec @ 248°C

Pb−Free <2 to 3 sec @ 260°C

4.0

°C/W

265

°C

265

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the

Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may

affect device reliability.

5. JEDEC standard multilayer board − 1S2P (1 signal, 2 power)

http://onsemi.com

4

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