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NB6L295MNTXG View Datasheet(PDF) - ON Semiconductor

Part NameDescriptionManufacturer
NB6L295MNTXG 2.5V / 3.3V Dual Channel Programmable Clock/Data Delay with Differential CML Outputs ON-Semiconductor
ON Semiconductor ON-Semiconductor
NB6L295MNTXG Datasheet PDF : 14 Pages
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NB6L295
Table 2. ATTRIBUTES
Characteristics
Input Default State Resistors
ESD Protection
Human Body Model
Machine Model
Moisture Sensitivity (Note 3)
QFN24
Flammability Rating
Oxygen Index: 28 to 34
Transistor Count
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
3. For additional information, see Application Note AND8003/D.
Value
37 kW
> 2 kV
> 100V
Level 1
UL 94 V0 @ 0.125 in
3094
Table 3. MAXIMUM RATINGS
Symbol
Parameter
Condition 1
Condition 2
Rating
Unit
VCC, VCC0, Positive Power Supply
VCC1
GND = 0 V
4.0
V
VIO
Positive Input/Output Voltage
GND = 0 V
0.5 v VIO v VCC + 0.5
4.5
V
VINPP
Differential Input Voltage
|INx INx|
VCC GND
V
IIN
Input Current Through RT (50 W Resistor)
$50
mA
IOUT
Output Current (LVPECL Output)
Continuous
Surge
50
mA
100
mA
TA
Operating Temperature Range
Tstg
Storage Temperature Range
qJA
Thermal Resistance (JunctiontoAmbient) 0 lfpm
QFN24
(Note 4)
500 lfpm
QFN24
40 to +85
65 to +150
37
32
°C
°C
°C/W
°C/W
qJC
Thermal Resistance (JunctiontoCase)
(Note 4)
QFN24
11
°C/W
Tsol
Wave Solder PbFree
265
°C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
4. JEDEC standard multilayer board 2S2P (2 signal, 2 power) with 8 filled thermal vias under exposed pad.
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