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N08L63W2A View Datasheet(PDF) - ON Semiconductor

Part Name
Description
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N08L63W2A Datasheet PDF : 10 Pages
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N08L63W2A
Timing Test Conditions
Item
Input Pulse Level
Input Rise and Fall Time
Input and Output Timing Reference Levels
Output Load
Operating Temperature
0.1VCC to 0.9 VCC
5ns
0.5 VCC
CL = 30pF
-40 to +85 oC
Timing
Item
Symbol
Read Cycle Time
Address Access Time (Random Access)
Address Access Time (Page Mode)
Chip Enable to Valid Output
Output Enable to Valid Output
Byte Select to Valid Output
Chip Enable to Low-Z output
Output Enable to Low-Z Output
Byte Select to Low-Z Output
Chip Disable to High-Z Output
Output Disable to High-Z Output
Byte Select Disable to High-Z Output
Output Hold from Address Change
Write Cycle Time
Chip Enable to End of Write
Address Valid to End of Write
Byte Select to End of Write
Write Pulse Width
Address Setup Time
Write Recovery Time
Write to High-Z Output
Data to Write Time Overlap
Data Hold from Write Time
End Write to Low-Z Output
tRC
tAA
tAAP
tCO
tOE
tLB, tUB
tLZ
tOLZ
tLBZ, tUBZ
tHZ
tOHZ
tLBHZ, tUBHZ
tOH
tWC
tCW
tAW
tLBW, tUBW
tWP
tAS
tWR
tWHZ
tDW
tDH
tOW
2.3 - 3.6 V
Min.
Max.
85
85
30
85
30
85
10
5
10
0
20
0
20
0
20
5
85
50
50
50
40
0
0
20
40
0
5
2.7 - 3.6 V
Min.
Max.
70
70
25
70
25
70
10
5
10
0
20
0
20
0
20
5
70
50
50
50
40
0
0
20
40
0
5
Units
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Rev. 8 | Page 5 of 10 | www.onsemi.com
 

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