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MOC3031TM View Datasheet(PDF) - Fairchild Semiconductor

Part Name
Description
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MOC3031TM Datasheet PDF : 12 Pages
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Absolute Maximum Ratings (TA = 25°C unless otherwise noted)
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Symbol
Parameters
TOTAL DEVICE
TSTG
TOPR
TSOL
Storage Temperature
Operating Temperature
Lead Solder Temperature
TJ
VISO
PD
Junction Temperature Range
Isolation Surge Voltage(1)
(peak AC voltage, 60Hz, 1 sec. duration, II-O 2µA)
Total Device Power Dissipation @ 25°C
Derate above 25°C
EMITTER
IF
Continuous Forward Current
VR
Reverse Voltage
PD
Total Power Dissipation 25°C Ambient
Derate above 25°C
DETECTOR
VDRM Off-State Output Terminal Voltage
ITSM
PD
Peak Repetitive Surge Current
(PW = 100µs, 120 pps)
Total Power Dissipation @ 25°C Ambient
Derate above 25°C
Device
Value
All
-40 to +150
All
-40 to +85
All
260 for 10
sec
All
-40 to +100
All
7500
All
250
2.94
All
60
All
6
All
120
1.41
MOC3031M/2M/3M
250
MOC3041M/2M/3M
400
All
1
All
150
All
1.76
Units
°C
°C
°C
°C
Vac(pk)
mW
mW/°C
mA
V
mW
mW/°C
V
A
mW
mW/°C
Note
1. Isolation surge voltage, VISO, is an internal device dielectric breakdown rating. For this test, Pins 1 and 2 are
common, and Pins 4, 5 and 6 are common.
©2005 Fairchild Semiconductor Corporation
MOC303XM, MOC304XM Rev. 1.0.7
2
www.fairchildsemi.com
 

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